Ratnesh Kumar

Headshot Photo
First Name: 
Ratnesh
Last Name: 
Kumar

Ratnesh Kumar is a Professor of Electrical & Computer Engineering at the Iowa State University, and prior to which he was with the ECE Dept. at the Univ. of Kentucky. He received B.Tech. in Electrical Eng. from Indian Institute of Technology, Kanpur (IITK) in 1987, and M.S. and Ph.D. in Electrical & Computer Engineering from the Univ. of Texas, Austin (UTAustin) in 1989 and 1991, respectively. Ratnesh's research interest spans sensors, networks, controls and software with application domains of cyberphysical (hybrid) systems, embedded and real-time systems, model-based software and web-services, power systems, energy harvesting, and sustainable agriculture. Ratnesh received Gold Medals from IITK, MCD Fellowship and Dissertation Award from UTAustin, Fellowships from NASA-Ames, Applied Research Lab-Penn State Univ, Idaho National Lab, and United Technologies Research Center, and several awards from NSF (including Research Initiation Award), DoE, ONR, General Motors, and Adobe. Ratnesh is a Fellow of the IEEE for contributions to discrete event system modeling, control, diagnosis and applications . Ratnesh has served on a number of editorial boards for IEEE and ACM, has been General/Program Chair and also given keynote talks at IEEE and ACM conferences. 

View his Iowa State University homepage, here.

Contact Information
Telephone: 
515-294-8523
Fax: 
515-294-3637
Affiliation: 
Iowa State University

Location

2215 Coover Hall
Ames, Iowa 50011
United States

Distinguished Lecture Program

Talk Title: Model-Based Testing and Monitoring for Embedded Software

In many application domains, Simulink/Stateflow serves as a platform for model-based development of the reactive embedded code, that interacts with its environment in real-time fashion. The talk will present a model-based approach for testing Simulink/Stateflow code, based on its automated translation to input-output extended finite automaton (I/O-EFA), followed by automated test-generation, guaranteeing user-defined code as well as requirements coverage, and also support for automated test-execution and error-localization. While testing is useful for design-time error analysis, the talk will further discuss our model-based approach for run-time error monitoring, detection and localization. Monitoring at system level (as opposed to software level) is necessarily stochastic, and a more general I/O-Stochastic Hybrid Automaton (I/O-SHA) model is used, and condition is obtained for bounded-delay detectability, and achieving desired levels of false-positives/-negatives.